AU4750 Pulsed IV/RF System

A compact and versatile test solution that accurately simulates real life. Designed for today… ready for tomorrow.

Auriga’s 3rd generation pulsed IV/RF measurement system, the AU4750, delivers unparalleled performance, capturing measurements with incredible accuracy and speed.

Pulsed IV (current–voltage) measurements have emerged as the preferred method of capturing current–voltage characteristics of active devices, such as field effect transistors (FETs) and bipolar junction transistors (BJTs). With the growing popularity of high-power devices like GaN HEMTs and LDMOS devices, current–voltage requirements are constantly being pushed higher and higher.

With these requirements in mind, we developed the AU4750, our latest generation pulsed IV/RF measurement system, which is designed to meet the ever-changing requirements of the device modeling community. With its modular hardware design and open software architecture, the AU4750 is poised to handle your present and future pulsed IV requirements.

This new, high-end pulsed IV measurement system is a full-featured, characterization platform that is capable of measuring DC IV and pulsed IV curves. Using Auriga’s RF Upgrade Kit, the system is easily expandable for pulsed S-parameters when integrated with an appropriate Agilent PNA. With pulse widths as narrow as 200 nSec and duty cycles as low as .001%, the AU4750 is suited for isothermal testing of devices subject to the effects of self-heating. Unlike less capable competitive solutions, the AU4750 can deliver up to 200V and 30A – a must for designers working with high-power devices.

It's all in the box.

The Auriga AU4750 and the Agilent PNA-X combine to create the ultimate Pulsed IV/RF Characterization System.